Zhi Sheng Ye, Min Xie 0001, Loon Ching Tang, Yan Shen. Degradation-Based Burn-In Planning Under Competing Risks. Technometrics, 54(2):159-168, 2012. [doi]
@article{Ye0TS12,
title = {Degradation-Based Burn-In Planning Under Competing Risks},
author = {Zhi Sheng Ye and Min Xie 0001 and Loon Ching Tang and Yan Shen},
year = {2012},
doi = {10.1080/00401706.2012.676946},
url = {http://dx.doi.org/10.1080/00401706.2012.676946},
researchr = {https://researchr.org/publication/Ye0TS12},
cites = {0},
citedby = {0},
journal = {Technometrics},
volume = {54},
number = {2},
pages = {159-168},
}