Bo Ye. A Low Power Test Data Compression Scheme for Scan Test. In Antonio J. Tallón-Ballesteros, editor, Proceedings of CECNet 2022 - The 12th International Conference on Electronics, Communications and Networks (CECNet 2022), 4-7 November 2022, Virtual Event / Xiamen, China. Volume 363 of Frontiers in Artificial Intelligence and Applications, pages 56-61, IOS Press, 2022. [doi]
@inproceedings{Ye22-13,
title = {A Low Power Test Data Compression Scheme for Scan Test},
author = {Bo Ye},
year = {2022},
doi = {10.3233/FAIA220518},
url = {https://doi.org/10.3233/FAIA220518},
researchr = {https://researchr.org/publication/Ye22-13},
cites = {0},
citedby = {0},
pages = {56-61},
booktitle = {Proceedings of CECNet 2022 - The 12th International Conference on Electronics, Communications and Networks (CECNet 2022), 4-7 November 2022, Virtual Event / Xiamen, China},
editor = {Antonio J. Tallón-Ballesteros},
volume = {363},
series = {Frontiers in Artificial Intelligence and Applications},
publisher = {IOS Press},
isbn = {978-1-64368-369-0},
}