Jing Ye, Xiaolin Zhang, Yu Hu, Xiaowei Li. Substantial Fault Pair At-a-Time (SFPAT): An Automatic Diagnostic Pattern Generation Method. In Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China. pages 192-197, IEEE Computer Society, 2010. [doi]
@inproceedings{YeZHL10,
title = {Substantial Fault Pair At-a-Time (SFPAT): An Automatic Diagnostic Pattern Generation Method},
author = {Jing Ye and Xiaolin Zhang and Yu Hu and Xiaowei Li},
year = {2010},
doi = {10.1109/ATS.2010.42},
url = {http://dx.doi.org/10.1109/ATS.2010.42},
tags = {diagnostics},
researchr = {https://researchr.org/publication/YeZHL10},
cites = {0},
citedby = {0},
pages = {192-197},
booktitle = {Proceedings of the 19th IEEE Asian Test Symposium, ATS 2010, 1-4 December 2010, Shanghai, China},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-4248-5},
}