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Adam Yeh, Jonathan Tang, Youxuan Jin, Sam Skrivan. Analytical view of business data. In Won Kim, Ron Kohavi, Johannes Gehrke, William DuMouchel, editors, Proceedings of the Tenth ACM SIGKDD International Conference on Knowledge Discovery and Data Mining, Seattle, Washington, USA, August 22-25, 2004. pages 847-852, ACM, 2004. [doi]

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