Tzu-Chang Yeh, Yan-jun Wang, Tsai-Chi Kuo, Sheng-Shih Wang. Securing RFID systems conforming to EPC Class 1 Generation 2 standard. Expert Syst. Appl., 37(12):7678-7683, 2010. [doi]
@article{YehWKW10,
title = {Securing RFID systems conforming to EPC Class 1 Generation 2 standard},
author = {Tzu-Chang Yeh and Yan-jun Wang and Tsai-Chi Kuo and Sheng-Shih Wang},
year = {2010},
doi = {10.1016/j.eswa.2010.04.074},
url = {http://dx.doi.org/10.1016/j.eswa.2010.04.074},
researchr = {https://researchr.org/publication/YehWKW10},
cites = {0},
citedby = {0},
journal = {Expert Syst. Appl.},
volume = {37},
number = {12},
pages = {7678-7683},
}