2 / bit Physically Unclonable Function Exploiting Channel Charge Injection and Mismatch Accumulation - researchr publication authors

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Injune Yeo, Dong-Woo Jee, Jae-sun Seo. 2 / bit Physically Unclonable Function Exploiting Channel Charge Injection and Mismatch Accumulation. In IEEE Custom Integrated Circuits Conference, CICC 2023, San Antonio, TX, USA, April 23-26, 2023. pages 1-2, IEEE, 2023. [doi]

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