Greg Yeric. Design, technology and yield in the post-moore era. In 2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014. pages 1, IEEE, 2014. [doi]
@inproceedings{Yeric14,
title = {Design, technology and yield in the post-moore era},
author = {Greg Yeric},
year = {2014},
doi = {10.1109/TEST.2014.7035310},
url = {http://doi.ieeecomputersociety.org/10.1109/TEST.2014.7035310},
researchr = {https://researchr.org/publication/Yeric14},
cites = {0},
citedby = {0},
pages = {1},
booktitle = {2014 International Test Conference, ITC 2014, Seattle, WA, USA, October 20-23, 2014},
publisher = {IEEE},
isbn = {978-1-4799-4722-5},
}