Dit-Yan Yeung, Hong Chang. Extending the relevant component analysis algorithm for metric learning using both positive and negative equivalence constraints. Pattern Recognition, 39(5):1007-1010, 2006. [doi]
@article{YeungC06,
title = {Extending the relevant component analysis algorithm for metric learning using both positive and negative equivalence constraints},
author = {Dit-Yan Yeung and Hong Chang},
year = {2006},
doi = {10.1016/j.patcog.2005.12.004},
url = {http://dx.doi.org/10.1016/j.patcog.2005.12.004},
tags = {analysis, constraints},
researchr = {https://researchr.org/publication/YeungC06},
cites = {0},
citedby = {0},
journal = {Pattern Recognition},
volume = {39},
number = {5},
pages = {1007-1010},
}