Xiao-jian Yi, Jian Shi, Jun Cheng. Reliability technology using GO methodology: A review. Quality and Reliability Eng. Int., 35(8):2513-2539, 2019. [doi]
@article{YiSC19,
title = {Reliability technology using GO methodology: A review},
author = {Xiao-jian Yi and Jian Shi and Jun Cheng},
year = {2019},
doi = {10.1002/qre.2541},
url = {https://doi.org/10.1002/qre.2541},
researchr = {https://researchr.org/publication/YiSC19},
cites = {0},
citedby = {0},
journal = {Quality and Reliability Eng. Int.},
volume = {35},
number = {8},
pages = {2513-2539},
}