Shen Yin, Steven X. Ding, Reinaldo M. Palhares. Special issue on recent advances on control and diagnosis via process measurements. J. Franklin Institute, 354(Issue):2461-2464, 2017. [doi]
@article{YinDP17,
title = {Special issue on recent advances on control and diagnosis via process measurements},
author = {Shen Yin and Steven X. Ding and Reinaldo M. Palhares},
year = {2017},
doi = {10.1016/j.jfranklin.2017.01.017},
url = {https://doi.org/10.1016/j.jfranklin.2017.01.017},
researchr = {https://researchr.org/publication/YinDP17},
cites = {0},
citedby = {0},
journal = {J. Franklin Institute},
volume = {354},
number = {Issue},
pages = {2461-2464},
}