Raymond K. K. Yip. A Hough transform technique for the detection of reflectional symmetry and skew-symmetry. Pattern Recognition Letters, 21(2):117-130, 2000. [doi]
@article{Yip00,
title = {A Hough transform technique for the detection of reflectional symmetry and skew-symmetry},
author = {Raymond K. K. Yip},
year = {2000},
doi = {10.1016/S0167-8655(99)00138-5},
url = {http://dx.doi.org/10.1016/S0167-8655(99)00138-5},
tags = {reflection},
researchr = {https://researchr.org/publication/Yip00},
cites = {0},
citedby = {0},
journal = {Pattern Recognition Letters},
volume = {21},
number = {2},
pages = {117-130},
}