Application of signal and noise theory to digital VLSI testing

Nitin Yogi, Vishwani D. Agrawal. Application of signal and noise theory to digital VLSI testing. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA. pages 215-220, IEEE Computer Society, 2010. [doi]

Authors

Nitin Yogi

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Vishwani D. Agrawal

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