Youngjin Yoo, HoCheon Wey, SeongDeok Lee, Chang-Yong Kim. Profile based fast noise estimation and high ISO noise reduction for digital cameras. In Jeffrey M. DiCarlo, Brian G. Rodricks, editors, Digital Photography IV, San Jose, CA, USA, January 28-29, 2008. Volume 6817 of SPIE Proceedings, SPIE, 2008. [doi]
@inproceedings{YooWLK08,
title = {Profile based fast noise estimation and high ISO noise reduction for digital cameras},
author = {Youngjin Yoo and HoCheon Wey and SeongDeok Lee and Chang-Yong Kim},
year = {2008},
doi = {10.1117/12.766297},
url = {http://dx.doi.org/10.1117/12.766297},
researchr = {https://researchr.org/publication/YooWLK08},
cites = {0},
citedby = {0},
booktitle = {Digital Photography IV, San Jose, CA, USA, January 28-29, 2008},
editor = {Jeffrey M. DiCarlo and Brian G. Rodricks},
volume = {6817},
series = {SPIE Proceedings},
publisher = {SPIE},
isbn = {978-0-8194-6989-2},
}