Won-Ju Yoon, Sang-Hwa Chung. ISS-TCA: An Identified Slot Scan-Based Tag Collection Algorithm for Performance Improvement in Active RFID Systems. IEEE Transactions on Industrial Electronics, 59(3):1662-1672, 2012. [doi]
@article{YoonC12-0,
title = {ISS-TCA: An Identified Slot Scan-Based Tag Collection Algorithm for Performance Improvement in Active RFID Systems},
author = {Won-Ju Yoon and Sang-Hwa Chung},
year = {2012},
doi = {10.1109/TIE.2011.2163374},
url = {http://dx.doi.org/10.1109/TIE.2011.2163374},
researchr = {https://researchr.org/publication/YoonC12-0},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Industrial Electronics},
volume = {59},
number = {3},
pages = {1662-1672},
}