Doe Hyun Yoon, Mattan Erez. Virtualized ECC: Flexible Reliability in Main Memory. IEEE Micro, 31(1):11-19, 2011. [doi]
@article{YoonE11,
title = {Virtualized ECC: Flexible Reliability in Main Memory},
author = {Doe Hyun Yoon and Mattan Erez},
year = {2011},
doi = {10.1109/MM.2010.103},
url = {http://dx.doi.org/10.1109/MM.2010.103},
tags = {reliability},
researchr = {https://researchr.org/publication/YoonE11},
cites = {0},
citedby = {0},
journal = {IEEE Micro},
volume = {31},
number = {1},
pages = {11-19},
}