External Links

Cite Key

Statistics

  • References: 0
  • Cited by: 0
  • Reviews: 0
  • Bibliographies: 0

PDF

Researchr

Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.

Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.

Enhancing Lexical Representation of Test Coverage for Failure Clustering

Juyeon Yoon, Shin Yoo. Enhancing Lexical Representation of Test Coverage for Failure Clustering. In 36th IEEE/ACM International Conference on Automated Software Engineering, ASE 2021 - Workshops, Melbourne, Australia, November 15-19, 2021. pages 232-238, IEEE, 2021. [doi]

Authors

Juyeon Yoon

This author has not been identified. Look up 'Juyeon Yoon' in Google

Shin Yoo

This author has not been identified. Look up 'Shin Yoo' in Google
runs on