Takaki Yoshida, Masafumi Watari. A New Solution to Power Supply Voltage Drop Problems in Scan Testing. IEICE Transactions, 87-D(3):580-585, 2004. [doi]
@article{YoshidaW04,
title = {A New Solution to Power Supply Voltage Drop Problems in Scan Testing},
author = {Takaki Yoshida and Masafumi Watari},
year = {2004},
url = {http://search.ieice.org/bin/summary.php?id=e87-d_3_580},
tags = {testing},
researchr = {https://researchr.org/publication/YoshidaW04},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {87-D},
number = {3},
pages = {580-585},
}