Bayes optimal kernel discriminant analysis

Di You, Aleix M. Martínez. Bayes optimal kernel discriminant analysis. In The Twenty-Third IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2010, San Francisco, CA, USA, 13-18 June 2010. pages 3533-3538, IEEE, 2010. [doi]

Authors

Di You

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Aleix M. Martínez

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