VDIF-M: Multi-label Classification of Vehicle Defect Information Collection Based on Seq2seq Model

Xindong You, Yuwen Zhang, Baoan Li, Xueqiang Lv, Junmei Han. VDIF-M: Multi-label Classification of Vehicle Defect Information Collection Based on Seq2seq Model. In Yuyu Yin, Ying Li 0001, Honghao Gao, Jilin Zhang, editors, Mobile Computing, Applications, and Services - 10th EAI International Conference, MobiCASE 2019, Hangzhou, China, June 14-15, 2019, Proceedings. Volume 290 of Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering, pages 96-111, Springer, 2019. [doi]