On detecting abnormalities in digital mammography

Waleed A. Yousef, W. A. Mustafa, A. A. Ali, Naglaa A. Abdelrazek, Ahmed M. Farrag. On detecting abnormalities in digital mammography. In 39th IEEE Applied Imagery Pattern Recognition Workshop, AIPR 2010, Washington, DC, USA, October 13-15, 2010. pages 1-7, IEEE Computer Society, 2010. [doi]

Authors

Waleed A. Yousef

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W. A. Mustafa

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A. A. Ali

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Naglaa A. Abdelrazek

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Ahmed M. Farrag

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