Weiren Yu, Zhengming Ding, Chunming Hu, Hongfu Liu. Knowledge Reused Outlier Detection. IEEE Access, 7:43763-43772, 2019. [doi]
@article{YuDHL19,
title = {Knowledge Reused Outlier Detection},
author = {Weiren Yu and Zhengming Ding and Chunming Hu and Hongfu Liu},
year = {2019},
doi = {10.1109/ACCESS.2019.2906644},
url = {https://doi.org/10.1109/ACCESS.2019.2906644},
researchr = {https://researchr.org/publication/YuDHL19},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {7},
pages = {43763-43772},
}