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Scalable and accurate estimation of probabilistic behavior in sequential circuits

Chien-Chih Yu, John P. Hayes. Scalable and accurate estimation of probabilistic behavior in sequential circuits. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA. pages 165-170, IEEE Computer Society, 2010. [doi]

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Chien-Chih Yu

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John P. Hayes

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