Small sample size problem of fault diagnosis for process industry

ChunMei Yu, Quan Pan, Yongmei Cheng, Hongcai Zhang. Small sample size problem of fault diagnosis for process industry. In 8th IEEE International Conference on Control and Automation, ICCA 2010, Xiamen, China, June 9-11, 2010. pages 1721-1725, IEEE, 2010. [doi]

@inproceedings{YuPCZ10,
  title = {Small sample size problem of fault diagnosis for process industry},
  author = {ChunMei Yu and Quan Pan and Yongmei Cheng and Hongcai Zhang},
  year = {2010},
  doi = {10.1109/ICCA.2010.5524343},
  url = {http://dx.doi.org/10.1109/ICCA.2010.5524343},
  researchr = {https://researchr.org/publication/YuPCZ10},
  cites = {0},
  citedby = {0},
  pages = {1721-1725},
  booktitle = {8th IEEE International Conference on Control and Automation, ICCA 2010, Xiamen, China, June 9-11, 2010},
  publisher = {IEEE},
  isbn = {978-1-4244-5196-8},
}