Hee-Jin Yu, Chang-Hwan Son. Leaf Spot Attention Network for Apple Leaf Disease Identification. In 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2020, Seattle, WA, USA, June 14-19, 2020. pages 229-237, IEEE, 2020. [doi]
@inproceedings{YuS20-6,
title = {Leaf Spot Attention Network for Apple Leaf Disease Identification},
author = {Hee-Jin Yu and Chang-Hwan Son},
year = {2020},
doi = {10.1109/CVPRW50498.2020.00034},
url = {https://doi.org/10.1109/CVPRW50498.2020.00034},
researchr = {https://researchr.org/publication/YuS20-6},
cites = {0},
citedby = {0},
pages = {229-237},
booktitle = {2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition, CVPR Workshops 2020, Seattle, WA, USA, June 14-19, 2020},
publisher = {IEEE},
isbn = {978-1-7281-9360-1},
}