Modeling and Analysis of Micro-bubble Stiffness Measured by Atomic Force Microscopy

Huiyang Yu, Zhiyong Sun, Yuxuan Xue, Ning Xi 0001. Modeling and Analysis of Micro-bubble Stiffness Measured by Atomic Force Microscopy. In 14th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2019, Bangkok, Thailand, April 11-14, 2019. pages 209-212, IEEE, 2019. [doi]

@inproceedings{YuSX019,
  title = {Modeling and Analysis of Micro-bubble Stiffness Measured by Atomic Force Microscopy},
  author = {Huiyang Yu and Zhiyong Sun and Yuxuan Xue and Ning Xi 0001},
  year = {2019},
  doi = {10.1109/NEMS.2019.8915642},
  url = {https://doi.org/10.1109/NEMS.2019.8915642},
  researchr = {https://researchr.org/publication/YuSX019},
  cites = {0},
  citedby = {0},
  pages = {209-212},
  booktitle = {14th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2019, Bangkok, Thailand, April 11-14, 2019},
  publisher = {IEEE},
  isbn = {978-1-7281-1629-7},
}