Yongjian Yu, Jue Wang. Beam hardening-respecting flat field correction of digital X-ray detectors. In 19th IEEE International Conference on Image Processing, ICIP 2012, Lake Buena Vista, Orlando, FL, USA, September 30 - October 3, 2012. pages 2085-2088, IEEE, 2012. [doi]
@inproceedings{YuW12,
title = {Beam hardening-respecting flat field correction of digital X-ray detectors},
author = {Yongjian Yu and Jue Wang},
year = {2012},
doi = {10.1109/ICIP.2012.6467302},
url = {http://dx.doi.org/10.1109/ICIP.2012.6467302},
researchr = {https://researchr.org/publication/YuW12},
cites = {0},
citedby = {0},
pages = {2085-2088},
booktitle = {19th IEEE International Conference on Image Processing, ICIP 2012, Lake Buena Vista, Orlando, FL, USA, September 30 - October 3, 2012},
publisher = {IEEE},
isbn = {978-1-4673-2534-9},
}