Tingting Yu, Wei Wen, Xue Han, Jane Huffman Hayes. Predicting Testability of Concurrent Programs. In 2016 IEEE International Conference on Software Testing, Verification and Validation, ICST 2016, Chicago, IL, USA, April 11-15, 2016. pages 168-179, IEEE Computer Society, 2016. [doi]
@inproceedings{YuWHH16,
title = {Predicting Testability of Concurrent Programs},
author = {Tingting Yu and Wei Wen and Xue Han and Jane Huffman Hayes},
year = {2016},
doi = {10.1109/ICST.2016.39},
url = {http://doi.ieeecomputersociety.org/10.1109/ICST.2016.39},
researchr = {https://researchr.org/publication/YuWHH16},
cites = {0},
citedby = {0},
pages = {168-179},
booktitle = {2016 IEEE International Conference on Software Testing, Verification and Validation, ICST 2016, Chicago, IL, USA, April 11-15, 2016},
publisher = {IEEE Computer Society},
isbn = {978-1-5090-1827-7},
}