George Jie Yuan, Nabil H. Farhat, Jan Van der Spiegel. Background Calibration With Piecewise Linearized Error Model for CMOS Pipeline A/D Converter. IEEE Trans. on Circuits and Systems, 55-I(1):311-321, 2008. [doi]
@article{YuanFS08,
title = {Background Calibration With Piecewise Linearized Error Model for CMOS Pipeline A/D Converter},
author = {George Jie Yuan and Nabil H. Farhat and Jan Van der Spiegel},
year = {2008},
doi = {10.1109/TCSI.2007.910645},
url = {http://dx.doi.org/10.1109/TCSI.2007.910645},
researchr = {https://researchr.org/publication/YuanFS08},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on Circuits and Systems},
volume = {55-I},
number = {1},
pages = {311-321},
}