Impact of Common Mode Current Induced by Transformer on Electromagnetic Radiation in Digital Isolation Chip

Yidong Yuan, Tianmeng Zhang, Chaoyi Wang, Lu Tian, Jinchun Gao. Impact of Common Mode Current Induced by Transformer on Electromagnetic Radiation in Digital Isolation Chip. In Proceedings of the 12th International Conference on Communication and Network Security, ICCNS 2022, Beijing, China, December 1-3, 2022. pages 125-130, ACM, 2022. [doi]

@inproceedings{YuanZWTG22,
  title = {Impact of Common Mode Current Induced by Transformer on Electromagnetic Radiation in Digital Isolation Chip},
  author = {Yidong Yuan and Tianmeng Zhang and Chaoyi Wang and Lu Tian and Jinchun Gao},
  year = {2022},
  doi = {10.1145/3586102.3586121},
  url = {https://doi.org/10.1145/3586102.3586121},
  researchr = {https://researchr.org/publication/YuanZWTG22},
  cites = {0},
  citedby = {0},
  pages = {125-130},
  booktitle = {Proceedings of the 12th International Conference on Communication and Network Security, ICCNS 2022, Beijing, China, December 1-3, 2022},
  publisher = {ACM},
  isbn = {978-1-4503-9752-0},
}