Jang-Gn Yun, Il Han Park, Seongjae Cho, Jung Hoon Lee, Doo-Hyun Kim, Gil Sung Lee, Yoon Kim, Jong Duk Lee, Byung-Gook Park. Characterization of 2-bit Recessed Channel Memory with Lifted-Charge Trapping Node (L-CTN) Scheme. IEICE Transactions, 91-C(5):742-746, 2008. [doi]
@article{YunPCLKLKLP08,
title = {Characterization of 2-bit Recessed Channel Memory with Lifted-Charge Trapping Node (L-CTN) Scheme},
author = {Jang-Gn Yun and Il Han Park and Seongjae Cho and Jung Hoon Lee and Doo-Hyun Kim and Gil Sung Lee and Yoon Kim and Jong Duk Lee and Byung-Gook Park},
year = {2008},
doi = {10.1093/ietele/e91-c.5.742},
url = {http://dx.doi.org/10.1093/ietele/e91-c.5.742},
researchr = {https://researchr.org/publication/YunPCLKLKLP08},
cites = {0},
citedby = {0},
journal = {IEICE Transactions},
volume = {91-C},
number = {5},
pages = {742-746},
}