Yeohyeok Yun, Ji-Hoon Seo, Donghee Son, Bongkoo Kang. Method to estimate profile of threshold voltage degradation in MOSFETs due to electrical stress. Microelectronics Reliability, 88:186-190, 2018. [doi]
@article{YunSSK18,
title = {Method to estimate profile of threshold voltage degradation in MOSFETs due to electrical stress},
author = {Yeohyeok Yun and Ji-Hoon Seo and Donghee Son and Bongkoo Kang},
year = {2018},
doi = {10.1016/j.microrel.2018.07.055},
url = {https://doi.org/10.1016/j.microrel.2018.07.055},
researchr = {https://researchr.org/publication/YunSSK18},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {88},
pages = {186-190},
}