An Abstract Fault Model for NAND Flash Memory

JiHyuck Yun, Jinhyuk Yoon, Eyee Hyun Nam, Sang Lyul Min. An Abstract Fault Model for NAND Flash Memory. Embedded Systems Letters, 4(4):86-89, 2012. [doi]

@article{YunYNM12,
  title = {An Abstract Fault Model for NAND Flash Memory},
  author = {JiHyuck Yun and Jinhyuk Yoon and Eyee Hyun Nam and Sang Lyul Min},
  year = {2012},
  doi = {10.1109/LES.2012.2213235},
  url = {http://dx.doi.org/10.1109/LES.2012.2213235},
  researchr = {https://researchr.org/publication/YunYNM12},
  cites = {0},
  citedby = {0},
  journal = {Embedded Systems Letters},
  volume = {4},
  number = {4},
  pages = {86-89},
}