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Scan based speed-path debug for a microprocessor

Jing Zeng, Ruifeng Guo, Wu-Tung Cheng, Michael Mateja, Jing Wang, Kun-Han Tsai, Ken Amstutz. Scan based speed-path debug for a microprocessor. In 15th European Test Symposium (ETS 2010), May 24-28, 2010, Prague, Czech Republic. pages 207-212, IEEE Computer Society, 2010. [doi]

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Jing Zeng

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Ruifeng Guo

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Wu-Tung Cheng

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Michael Mateja

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Jing Wang

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Kun-Han Tsai

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Ken Amstutz

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