Rethinking precision of pseudo label: Test-time adaptation via complementary learning

Longbin Zeng, Jiayi Han, Liang Du 0004, Weiyang Ding. Rethinking precision of pseudo label: Test-time adaptation via complementary learning. Pattern Recognition Letters, 177:96-102, January 2024. [doi]

Authors

Longbin Zeng

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Jiayi Han

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Liang Du 0004

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Weiyang Ding

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