Guang Zeng, F. Wenisch-Kober, J. Lutz. Study on power cycling test with different control strategies. Microelectronics Reliability, 88:756-761, 2018. [doi]
@article{ZengWL18,
title = {Study on power cycling test with different control strategies},
author = {Guang Zeng and F. Wenisch-Kober and J. Lutz},
year = {2018},
doi = {10.1016/j.microrel.2018.07.088},
url = {https://doi.org/10.1016/j.microrel.2018.07.088},
researchr = {https://researchr.org/publication/ZengWL18},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {88},
pages = {756-761},
}