Fault detection for singular multiple time-delay systems with application to electrical circuit

Ding Zhai, Qingling Zhang 0001, Jinghao Li. Fault detection for singular multiple time-delay systems with application to electrical circuit. J. Franklin Institute, 351(12):5411-5436, 2014. [doi]

@article{Zhai0L14,
  title = {Fault detection for singular multiple time-delay systems with application to electrical circuit},
  author = {Ding Zhai and Qingling Zhang 0001 and Jinghao Li},
  year = {2014},
  doi = {10.1016/j.jfranklin.2014.09.012},
  url = {https://doi.org/10.1016/j.jfranklin.2014.09.012},
  researchr = {https://researchr.org/publication/Zhai0L14},
  cites = {0},
  citedby = {0},
  journal = {J. Franklin Institute},
  volume = {351},
  number = {12},
  pages = {5411-5436},
}