Chengyu Zhang. Stress testing SMT solvers via type-aware mutation. In Gregg Rothermel, Doo-Hwan Bae, editors, ICSE '20: 42nd International Conference on Software Engineering, Companion Volume, Seoul, South Korea, 27 June - 19 July, 2020. pages 119-121, ACM, 2020. [doi]
@inproceedings{Zhang20b-9,
title = {Stress testing SMT solvers via type-aware mutation},
author = {Chengyu Zhang},
year = {2020},
doi = {10.1145/3377812.3382166},
url = {https://doi.org/10.1145/3377812.3382166},
researchr = {https://researchr.org/publication/Zhang20b-9},
cites = {0},
citedby = {0},
pages = {119-121},
booktitle = {ICSE '20: 42nd International Conference on Software Engineering, Companion Volume, Seoul, South Korea, 27 June - 19 July, 2020},
editor = {Gregg Rothermel and Doo-Hwan Bae},
publisher = {ACM},
isbn = {978-1-4503-7122-3},
}