Gen Zhang. Detecting Memory Life-Cycle Bugs With Extended Define-Use Chain Analysis. IEEE Access, 8:114968-114980, 2020. [doi]
@article{Zhang20f,
title = {Detecting Memory Life-Cycle Bugs With Extended Define-Use Chain Analysis},
author = {Gen Zhang},
year = {2020},
doi = {10.1109/ACCESS.2020.2999351},
url = {https://doi.org/10.1109/ACCESS.2020.2999351},
researchr = {https://researchr.org/publication/Zhang20f},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {8},
pages = {114968-114980},
}