Machine fault detection during transient operation using measurement denoising - researchr publication authors

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Yu Zhang, Chris Bingham, Michael Gallimore, Zhijing Yang, Jun Chen. Machine fault detection during transient operation using measurement denoising. In IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications, CIVEMSA 2013, Milan, Italy, July 15-17, 2013. pages 110-115, IEEE, 2013. [doi]

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