Soft matching network with application to defect inspection

Haodong Zhang, Yongquan Chen, Bin Liu, Xinping Guan, Xinyi Le. Soft matching network with application to defect inspection. Knowl.-Based Syst., 225:107045, 2021. [doi]

Authors

Haodong Zhang

This author has not been identified. Look up 'Haodong Zhang' in Google

Yongquan Chen

This author has not been identified. Look up 'Yongquan Chen' in Google

Bin Liu

This author has not been identified. Look up 'Bin Liu' in Google

Xinping Guan

This author has not been identified. Look up 'Xinping Guan' in Google

Xinyi Le

This author has not been identified. Look up 'Xinyi Le' in Google