Superparamagnetic Particle Embedded Microprobe (SPEM) for GMR Sensor Sensitivity Calibration

Min Zhang, Franz-Josef Hormes, Pratul K. Ajmeraa, Kun Lian, Jost Goettert. Superparamagnetic Particle Embedded Microprobe (SPEM) for GMR Sensor Sensitivity Calibration. In 2005 International Conference on MEMS, NANO, and Smart Systems (ICMENS 2005), 24-27 July 2005, Banff, Alberta, Canada. pages 175-178, IEEE Computer Society, 2005. [doi]

Authors

Min Zhang

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Franz-Josef Hormes

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Pratul K. Ajmeraa

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Kun Lian

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Jost Goettert

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