Shifeng Zhang, Yan Han, Koubao Ding, Bin Zhang, Jiaxian Hu. Investigation on hot-carrier-induced degradation of SOI NLIGBT. Microelectronics Reliability, 51(6):1097-1104, 2011. [doi]
@article{ZhangHDZH11,
title = {Investigation on hot-carrier-induced degradation of SOI NLIGBT},
author = {Shifeng Zhang and Yan Han and Koubao Ding and Bin Zhang and Jiaxian Hu},
year = {2011},
doi = {10.1016/j.microrel.2011.02.009},
url = {http://dx.doi.org/10.1016/j.microrel.2011.02.009},
researchr = {https://researchr.org/publication/ZhangHDZH11},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {51},
number = {6},
pages = {1097-1104},
}