Detection of Apple Defects Based on the FCM-NPGA and a Multivariate Image Analysis

Wenzhuo Zhang, Juan Hu, Guoxiong Zhou, Mingfang He. Detection of Apple Defects Based on the FCM-NPGA and a Multivariate Image Analysis. IEEE Access, 8:38833-38845, 2020. [doi]

Authors

Wenzhuo Zhang

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Juan Hu

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Guoxiong Zhou

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Mingfang He

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