Tingting Zhang, Geuk Young Jang, Tong In Oh, Kyung Woon Jeung, Hun Wi, Eung Je Woo. Source Consistency Electrical Impedance Tomography. SIAM Journal of Applied Mathematics, 80(1):499-520, 2020. [doi]
@article{ZhangJOJWW20,
title = {Source Consistency Electrical Impedance Tomography},
author = {Tingting Zhang and Geuk Young Jang and Tong In Oh and Kyung Woon Jeung and Hun Wi and Eung Je Woo},
year = {2020},
doi = {10.1137/18M1225264},
url = {https://doi.org/10.1137/18M1225264},
researchr = {https://researchr.org/publication/ZhangJOJWW20},
cites = {0},
citedby = {0},
journal = {SIAM Journal of Applied Mathematics},
volume = {80},
number = {1},
pages = {499-520},
}