Yuwei Zhang, Dahai Jin, Ying Xing, Yunzhan Gong. Automated defect identification via path analysis-based features with transfer learning. Journal of Systems and Software, 166:110585, 2020. [doi]
@article{ZhangJXG20,
title = {Automated defect identification via path analysis-based features with transfer learning},
author = {Yuwei Zhang and Dahai Jin and Ying Xing and Yunzhan Gong},
year = {2020},
doi = {10.1016/j.jss.2020.110585},
url = {https://doi.org/10.1016/j.jss.2020.110585},
researchr = {https://researchr.org/publication/ZhangJXG20},
cites = {0},
citedby = {0},
journal = {Journal of Systems and Software},
volume = {166},
pages = {110585},
}