New scan-based test strategy for a dependable many-core processor using a NoC as a Test Access Mechanism - researchr publication authors

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Xiao Zhang, Hans G. Kerkhoff, Bart Vermeulen. New scan-based test strategy for a dependable many-core processor using a NoC as a Test Access Mechanism. In 15th European Test Symposium (ETS 2010), May 24-28, 2010, Prague, Czech Republic. pages 243, IEEE Computer Society, 2010. [doi]

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