Worst-case noise prediction using power network impedance profile

Xiang Zhang, Yang Liu, Chung-Kuan Cheng. Worst-case noise prediction using power network impedance profile. In ACM/IEEE International Workshop on System Level Interconnect Prediction, SLIP 2013, Austin, TX, USA, June 2, 2013. pages 1-8, IEEE, 2013. [doi]

@inproceedings{ZhangLC13-3,
  title = {Worst-case noise prediction using power network impedance profile},
  author = {Xiang Zhang and Yang Liu and Chung-Kuan Cheng},
  year = {2013},
  doi = {10.1109/SLIP.2013.6681681},
  url = {http://dx.doi.org/10.1109/SLIP.2013.6681681},
  researchr = {https://researchr.org/publication/ZhangLC13-3},
  cites = {0},
  citedby = {0},
  pages = {1-8},
  booktitle = {ACM/IEEE International Workshop on System Level Interconnect Prediction, SLIP 2013, Austin, TX, USA, June 2, 2013},
  publisher = {IEEE},
}