Xiang Zhang, Jingwei Lu, Yang Liu, Chung-Kuan Cheng. Worst-case noise area prediciton of on-chip power distribution network. In ACM/IEEE International Workshop on System Level Interconnect Prediction, SLIP 2014, San Francisco, CA, USA, June 1, 2014. pages 1-8, IEEE, 2014. [doi]
@inproceedings{ZhangLLC14,
title = {Worst-case noise area prediciton of on-chip power distribution network},
author = {Xiang Zhang and Jingwei Lu and Yang Liu and Chung-Kuan Cheng},
year = {2014},
doi = {10.1145/2633948.2633951},
url = {http://dx.doi.org/10.1145/2633948.2633951},
researchr = {https://researchr.org/publication/ZhangLLC14},
cites = {0},
citedby = {0},
pages = {1-8},
booktitle = {ACM/IEEE International Workshop on System Level Interconnect Prediction, SLIP 2014, San Francisco, CA, USA, June 1, 2014},
publisher = {IEEE},
}