Qingwei Zhang, Ping Li, Yongbo Liao, Gang Wang, Rongzhou Zeng, Heng Wang. A reverse hysteresis effect of graphene transistors with amorphous silicon gate dielectric. Microelectronics Reliability, 85:118-121, 2018. [doi]
@article{ZhangLLWZW18,
title = {A reverse hysteresis effect of graphene transistors with amorphous silicon gate dielectric},
author = {Qingwei Zhang and Ping Li and Yongbo Liao and Gang Wang and Rongzhou Zeng and Heng Wang},
year = {2018},
doi = {10.1016/j.microrel.2018.04.012},
url = {https://doi.org/10.1016/j.microrel.2018.04.012},
researchr = {https://researchr.org/publication/ZhangLLWZW18},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {85},
pages = {118-121},
}