Contrast-detail Analysis of a CMOS-based Digital X-ray Imaging System

Qirong Zhang, Yuhua Li, Ben Steele, Wei R. Chen, Xizeng Wu, John Cheung, Hong Liu. Contrast-detail Analysis of a CMOS-based Digital X-ray Imaging System. In Bidyut Gupta, editor, 19th International Conference on Computers and Their Applications, CATA 2004, March 18-20, 2004, Red Lion Hotel on Fifth Avenue, Seattle, Washington, USA. pages 51-54, ISCA, 2004.

@inproceedings{ZhangLSCWCL04,
  title = {Contrast-detail Analysis of a CMOS-based Digital X-ray Imaging System},
  author = {Qirong Zhang and Yuhua Li and Ben Steele and Wei R. Chen and Xizeng Wu and John Cheung and Hong Liu},
  year = {2004},
  tags = {rule-based, analysis},
  researchr = {https://researchr.org/publication/ZhangLSCWCL04},
  cites = {0},
  citedby = {0},
  pages = {51-54},
  booktitle = {19th International Conference on Computers and Their Applications, CATA 2004, March 18-20, 2004, Red Lion Hotel on Fifth Avenue, Seattle, Washington, USA},
  editor = {Bidyut Gupta},
  publisher = {ISCA},
  isbn = {1-880843-50-1},
}